Conference Publication Details
Mandatory Fields
Hogan J.;Farrell R.
Proceedings of SPIE - The International Society for Optical Engineering
Voltage to frequency converter for DAC test
2005
December
Published
1
()
Optional Fields
Data converters Mixed signal testing Oscillators
522
533
In this paper a modified relaxation oscillator is proposed as the core of an analog to digital modulator for on chip signal extraction for test. The architecture uses digital current source generation and digital switching in place of active circuitry. The resulting design allows for high input sensitivity, robustness to component variation while occupying little silicon area. This paper provides solutions on the main challenges in implementing this modulator and how it may be integrated with a digital based tester.
10.1117/12.608479
Grant Details