Conference Publication Details
Mandatory Fields
Wilson, Simon and Flood, Ben and Goyal, Suresh and Mosher, Jim and Bergin, Susan and O'Brien, Joseph and Kennedy, Robert
Proceedings of the 25th IEEE VLSI Test Symmposium
Parameter Estimation for a Model with Both Imperfect Test and Repair
2007
January
Published
()
Optional Fields
271
276
Washington, DC, USA
http://dx.doi.org/10.1109/VTS.2007.48
Grant Details