We have studied the fragmentation of anthracene molecules induced by low energy electron impact.
A reflectron time-of-flight mass spectrometer has been used to mass resolve and detect positively charged fragments.
Using computer controlled data acquisition, mass spectra have been measured as a function of electron
impact from 5 to 100 eV. The mass spectra show clear indications of double and triple ionization. Ion yield
curves and appearance energies for most of the positive ions have been extracted from the data.